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DFT
2002
IEEE
127views VLSI» more  DFT 2002»
14 years 3 months ago
A New Functional Fault Model for FPGA Application-Oriented Testing
1 The objective of this paper is to propose a new fault model suitable for test pattern generation for an FPGA configured to implement a given application. The paper demonstrates t...
Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo ...
CEC
2009
IEEE
14 years 1 months ago
Automatic system identification based on coevolution of models and tests
In evolutionary robotics, controllers are often designed in simulation, then transferred onto the real system. Nevertheless, when no accurate model is available, controller transfe...
Sylvain Koos, Jean-Baptiste Mouret, Stéphan...
LICS
2002
IEEE
14 years 3 months ago
Probabilistic Abstraction for Model Checking: An Approach Based on Property Testing
istic Abstraction for Model Checking: an Approach Based on Property Testing∗ Sophie Laplante† Richard Lassaigne‡ Fr´ed´eric Magniez§ Sylvain Peyronnet† Michel de Rougemo...
Sophie Laplante, Richard Lassaigne, Fréd&ea...
CONSTRAINTS
2006
120views more  CONSTRAINTS 2006»
13 years 10 months ago
Constraint Models for the Covering Test Problem
Covering arrays can be applied to the testing of software, hardware and advanced materials, and to the effects of hormone interaction on gene expression. In this paper we develop c...
Brahim Hnich, Steven David Prestwich, Evgeny Selen...
ICASSP
2011
IEEE
13 years 1 months ago
Scalable robust hypothesis tests using graphical models
Traditional binary hypothesis testing relies on the precise knowledge of the probability density of an observed random vector conditioned on each hypothesis. However, for many app...
Divyanshu Vats, Vishal Monga, Umamahesh Srinivas, ...