This paper presents a state-based approach to testing aspect-oriented programs. Aspectual state models, as an extension to the testable FREE state model of classes, are exploited ...
An instrument is a random variable that is uncorrelated with certain (unobserved) error terms and, thus, allows the identification of structural parameters in linear models. In no...
We propose a novel BIST technique for non-scan sequential circuits which does not modify the circuit under test. It uses a learning algorithm to build a hardware test sequence gen...
This paper presents a method and a tool for building trustable OO components. The methodology is based on an integrated design and test approach for OO software components. It is ...
We present a new automatic test generation method for JAVA CARD based on attempts at formal verification of the implementation under test (IUT). Self-contained unit tests in JUnit...