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TAICPART
2010
IEEE
158views Education» more  TAICPART 2010»
15 years 19 days ago
Bad Pairs in Software Testing
Abstract. With pairwise testing, the test model is a list of N parameters. Each test case is an N-tuple; the test space is the cross product of the N parameters. A pairwise test is...
Daniel Hoffman, Chien Chang, Gary Bazdell, Brett S...
ANSS
2001
IEEE
15 years 5 months ago
Fault Identification in Networks by Passive Testing
In this paper, we employ the finite state machine (FSM) model for networks to investigate fault identification using passive testing. First, we introduce the concept of passive te...
Raymond E. Miller, Khaled A. Arisha
CSCLP
2004
Springer
15 years 6 months ago
Constraint-Based Approaches to the Covering Test Problem
Covering arrays have been studied for their applications to drug screening and software and hardware testing. In this paper, we model the problem as a constraint program. Our propo...
Brahim Hnich, Steven David Prestwich, Evgeny Selen...
RSP
2003
IEEE
117views Control Systems» more  RSP 2003»
15 years 7 months ago
Prototype-Based Tests for Hybrid Reactive Systems
Model-based testing relies on the use of behavior models to automatically generate sequences of inputs and expected outputs. These sequences can be used as test cases to the end o...
Gabor Hahn, Jan Philipps, Alexander Pretschner, Th...
GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
15 years 7 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham