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ISSTA
1998
ACM
14 years 3 days ago
Automatic Test Data Generation Using Constraint Solving Techniques
Automatic test data generation leads to identify input values on which a selected point in a procedure is executed. This paper introduces a new method for this problem based on co...
Arnaud Gotlieb, Bernard Botella, Michel Rueher
ICCAD
1995
IEEE
180views Hardware» more  ICCAD 1995»
13 years 11 months ago
Design based analog testing by Characteristic Observation Inference
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
Walter M. Lindermeir, Helmut E. Graeb, Kurt Antrei...
IWANN
1995
Springer
13 years 11 months ago
Test Pattern Generation for Analog Circuits Using Neural Networks and Evolutive Algorithms
This paper presents a comparative analysis of neural networks, simulated annealing, and genetic algorithms in the determination of input patterns for testing analog circuits. The ...
José Luis Bernier, Juan J. Merelo Guerv&oac...
CP
2009
Springer
14 years 8 months ago
Constraint-Based Optimal Testing Using DNNF Graphs
The goal of testing is to distinguish between a number of hypotheses about a systemfor example, dierent diagnoses of faults by applying input patterns and verifying or falsifying t...
Anika Schumann, Martin Sachenbacher, Jinbo Huang
CEC
2009
IEEE
14 years 2 months ago
An evaluation of Differential Evolution in software test data generation
— One of the main tasks software testing involves is the generation of the test inputs to be used during the test. Due to its expensive cost, the automation of this task has beco...
Ricardo Landa Becerra, Ramón Sagarna, Xin Y...