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KBSE
2008
IEEE
14 years 2 months ago
VCR: Virtual Capture and Replay for Performance Testing
This paper proposes a novel approach to performance testing, called Virtual Capture and Replay (VCR), that couples a capture-and-replay technique with the checkpointing capabiliti...
Antonia Bertolino, Guglielmo De Angelis, Antonino ...
VLDB
2004
ACM
97views Database» more  VLDB 2004»
14 years 1 months ago
CHICAGO: A Test and Evaluation Environment for Coarse-Grained Optimization
Relational OLAP tools and other database applications generate sequences of SQL statements that are sent to the database server as result of a single information request issued by...
Tobias Kraft, Holger Schwarz
ITC
2003
IEEE
126views Hardware» more  ITC 2003»
14 years 1 months ago
Deformations of IC Structure in Test and Yield Learning
This paper argues that the existing approaches to modeling and characterization of IC malfunctions are inadequate for test and yield learning of Deep Sub-Micron (DSM) products. Tr...
Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Tho...
ICCD
2002
IEEE
97views Hardware» more  ICCD 2002»
14 years 26 days ago
Fault Dictionary Size Reduction through Test Response Superposition
The exceedingly large size of fault dictionaries constitutes a fundamental obstacle to their usage. We outline a new method to reduce significantly the size of fault dictionaries...
Baris Arslan, Alex Orailoglu
IJCNN
2000
IEEE
14 years 9 days ago
Non-Destructive Test by the Hopfield Network
The aim of this work is to propose and discuss a technique which allows for classifying the defects found in metallic components on the basis of a non-destructive Remote-Field Edd...
S. Barcherini, L. Cipiccia, M. Maggi, Simone Fiori...