6941 search results - page 145 / 1389 » Testing as a Certification Approach |
DATE
2002
IEEE
14 years 27 days ago
2002
IEEE
Models meant for logic verification and simulation are often used for ATPG. For custom digital circuits, these models contain many tristate devices, which leads to lower fault co...
WSCG
2001
13 years 9 months ago
2001
In this article we present an algorithm to determine the intersection between rays and triangles based on the idea of the study of signs with respect to triangles. One of the adva...
EDBT
2009
ACM
14 years 2 months ago
2009
ACM
In recent years, large amount of data modeled by graphs, namely graph data, have been collected in various domains. Efficiently processing queries on graph databases has attracted...
ICSE
2008
IEEE-ACM
14 years 8 months ago
2008
IEEE-ACM
Substantial effort in the development of any large system is invested in testing. Studies of testing tend to be either technical or concerned with the cognitive ability of testers...
GI
2007
Springer
14 years 2 months ago
2007
Springer
: In this article we advocate an integrated approach for the automation of module or software integration testing and static analysis. It is illustrated how funmethods of static an...