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DELTA
2004
IEEE
13 years 11 months ago
Scan Test of IP Cores in an ATE Environment
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
Luca Schiano, Yong-Bin Kim, Fabrizio Lombardi
FMCO
2006
Springer
109views Formal Methods» more  FMCO 2006»
13 years 11 months ago
Model-Based Testing of Environmental Conformance of Components
Abstract. In component-based development, the correctness of a system depends on the correctness of the individual components and on their interactions. Model-based testing is a wa...
Lars Frantzen, Jan Tretmans
IJSEKE
2006
122views more  IJSEKE 2006»
13 years 8 months ago
A Tool to Automatically Map Implementation-based Testing Techniques to Classes
hibiting the characteristics of abstraction, encapsulation, genericity, inheritance, polymorphism, concurrency and exception handling. To address the difficulty of testing the feat...
Peter J. Clarke, Junhua Ding, Djuradj Babich, Bria...
TSMC
2008
94views more  TSMC 2008»
13 years 8 months ago
Test Sequencing in Complex Manufacturing Systems
Testing complex manufacturing systems, such as an ASML [1] lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be execu...
R. Boumen, I. S. M. de Jong, J. W. H. Vermunt, J. ...
JUCS
2010
107views more  JUCS 2010»
13 years 6 months ago
Systematic Unit Testing in a Read-eval-print Loop
: Lisp programmers constantly carry out experiments in a read-eval-print loop. The experimental activities convince the Lisp programmers that new or modified pieces of programs wo...
Kurt Nørmark