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SEW
2007
IEEE
14 years 2 months ago
Testing Patterns
: After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and...
Neelam Soundarajan, Jason O. Hallstrom, Adem Delib...
KBSE
2005
IEEE
14 years 1 months ago
An analysis of rule coverage as a criterion in generating minimal test suites for grammar-based software
The term grammar-based software describes software whose input can be specified by a context-free grammar. This grammar may occur explicitly in the software, in the form of an in...
Mark Hennessy, James F. Power
ATS
1998
IEEE
170views Hardware» more  ATS 1998»
14 years 13 days ago
A Ring Architecture Strategy for BIST Test Pattern Generation
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
Christophe Fagot, Olivier Gascuel, Patrick Girard,...
CONSTRAINTS
2007
112views more  CONSTRAINTS 2007»
13 years 8 months ago
Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Francisco Azevedo
ANSOFT
2002
94views more  ANSOFT 2002»
13 years 8 months ago
Testing Processes of Web Applications
Abstract. Current practice in Web application development is based on the skills of the individual programmers and often does not apply the principles of software engineering. The ...
Filippo Ricca, Paolo Tonella