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ASPLOS
2012
ACM
12 years 3 months ago
Path-exploration lifting: hi-fi tests for lo-fi emulators
Processor emulators are widely used to provide isolation and instrumentation of binary software. However they have proved difficult to implement correctly: processor specificati...
Lorenzo Martignoni, Stephen McCamant, Pongsin Poos...
ISSTA
2012
ACM
11 years 10 months ago
Isolating failure causes through test case generation
Manual debugging is driven by experiments—test runs that narrow down failure causes by systematically confirming or excluding individual factors. The BUGEX approach leverages t...
Jeremias Röbetaler, Gordon Fraser, Andreas Ze...
TAP
2010
Springer
102views Hardware» more  TAP 2010»
14 years 20 days ago
Generating High-Quality Tests for Boolean Circuits by Treating Tests as Proof Encoding
Abstract. We consider the problem of test generation for Boolean combinational circuits. We use a novel approach based on the idea of treating tests as a proof encoding rather than...
Eugene Goldberg, Panagiotis Manolios
ISSRE
2008
IEEE
14 years 2 months ago
Testing Software Product Lines Using Incremental Test Generation
We present a novel specification-based approach for generating tests for products in a software product line. Given properties of features as first-order logic formulas, our app...
Engin Uzuncaova, Daniel Garcia, Sarfraz Khurshid, ...
ALT
2008
Springer
14 years 4 months ago
Nonparametric Independence Tests: Space Partitioning and Kernel Approaches
Abstract. Three simple and explicit procedures for testing the independence of two multi-dimensional random variables are described. Two of the associated test statistics (L1, log-...
Arthur Gretton, László Györfi