747 search results - page 29 / 150 » Testing for tunneling opens |
VTS
1996
IEEE
13 years 11 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
SPIN
2005
Springer
14 years 1 months ago
2005
Springer
Abstract. This paper presents a technique that uses code to automatically generate its own test cases at run-time by using a combination of symbolic and concrete (i.e., regular) ex...
NOCS
2007
IEEE
14 years 1 months ago
2007
IEEE
Measuring and comparing performance, cost, and other features of advanced communication architectures for complex multi core/multiprocessor systems on chip is a significant challe...
HICSS
2006
IEEE
14 years 1 months ago
2006
IEEE
ABSTRACT. Risks associated with change in technology standards and uncertainty over the sharing of costs and benefits among trading partners impede interorganizational information ...
DSN
2000
IEEE
13 years 12 months ago
2000
IEEE
This paper tests the hypothesis that generic recovery techniques, such as process pairs, can survive most application faults without using application-specific information. We ex...