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ITC
1995
IEEE
122views Hardware» more  ITC 1995»
14 years 1 months ago
A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
Stefan Weiner
CCS
2010
ACM
14 years 28 days ago
RunTest: assuring integrity of dataflow processing in cloud computing infrastructures
Cloud computing has emerged as a multi-tenant resource sharing platform, which allows different service providers to deliver software as services in an economical way. However, fo...
Juan Du, Wei Wei, Xiaohui Gu, Ting Yu
ICDM
2002
IEEE
133views Data Mining» more  ICDM 2002»
14 years 2 months ago
Estimating the number of segments in time series data using permutation tests
Segmentation is a popular technique for discovering structure in time series data. We address the largely open problem of estimating the number of segments that can be reliably di...
Kari Vasko, Hannu Toivonen
ECCC
2007
69views more  ECCC 2007»
13 years 9 months ago
Testing Symmetric Properties of Distributions
We introduce the notion of a Canonical Tester for a class of properties on distributions, that is, a tester strong and general enough that “a distribution property in the class ...
Paul Valiant
IPPS
2003
IEEE
14 years 2 months ago
Benchmark and Framework for Encouraging Research on Multi-Threaded Testing Tools
A problem that has been getting prominence in testing is that of looking for intermittent bugs. Multi-threaded code is becoming very common, mostly on the server side. As there is...
Klaus Havelund, Scott D. Stoller, Shmuel Ur