1664 search results - page 26 / 333 » Testing in the Component Age |
ATS
2004
IEEE
14 years 11 days ago
2004
IEEE
An efficient design for test methodology to increase the test yield of analog circuits is presented. It is assumed that the analog circuits are tested using alternate tests that r...
TII
2008
13 years 8 months ago
2008
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
ASIAN
2006
Springer
14 years 11 days ago
2006
Springer
A component-based realtime system is a simple model for the server-client relation with time constraints. This paper presents an efficient algorithm, called a blackbox testing algo...
SIGSOFT
2006
ACM
14 years 2 months ago
2006
ACM
Unit test cases are focused and efficient. System tests are effective at exercising complex usage patterns. Differential unit tests (DUT) are a hybrid of unit and system tests. T...
ICSE
2003
IEEE-ACM
14 years 8 months ago
2003
IEEE-ACM
Software system faults are often caused by unexpected interactions among components. Yet the size of a test suite required to test all possible combinations of interactions can be...