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» Testing in the Component Age
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VTS
2000
IEEE
95views Hardware» more  VTS 2000»
14 years 2 months ago
DEFUSE: A Deterministic Functional Self-Test Methodology for Processors
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
Li Chen, Sujit Dey
IJCNN
2008
IEEE
14 years 4 months ago
Hybrid learning architecture for unobtrusive infrared tracking support
—The system architecture presented in this paper is designed for helping an aged person to live longer independently in their own home by detecting unusual and potentially hazard...
K. K. Kiran Bhagat, Stefan Wermter, Kevin Burn
IC
2007
13 years 11 months ago
Gordon Surface Modeling in a Network Environment
—With the advent of the Internet, we have entered the age of ubiquitous systems that will need to be able to communicate, establish criteria for measurement and then perform thes...
Jan Smid, Petr Volf
SEKE
2009
Springer
14 years 4 months ago
Resource Allocation for a Modular Software System
Most existing software optimization research assumes advance knowledge of the component parameters. Perfect future knowledge of fault detection is an unnecessary oversimplificati...
Lance Fiondella, Swapna S. Gokhale
EH
1999
IEEE
127views Hardware» more  EH 1999»
14 years 1 months ago
A System for Intrinsic Evolution of Linear and Non-Linear Filters
A system for exploring intrinsic evolution of linear and non-linear filter systems is described. It consists of a testbed topology of operational amplifiers and linear or non-line...
Stuart J. Flockton, Kevin Sheehan