Traditionally, application software developers carry out their tests on their own local development databases. However, such local databases usually have only a small number of sa...
BACKGROUND: Defect predictors learned from static code measures can isolate code modules with a higher than usual probability of defects. AIMS: To improve those learners by focusi...
In this work we study some probabilistic models for the random generation of words over a given alphabet used in the literature in connection with pattern statistics. Our goal is t...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Background: The identification of biologically interesting genes in a temporal expression profiling dataset is challenging and complicated by high levels of experimental noise. Mo...