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WPES
2003
ACM
14 years 3 months ago
Privacy preserving database application testing
Traditionally, application software developers carry out their tests on their own local development databases. However, such local databases usually have only a small number of sa...
Xintao Wu, Yongge Wang, Yuliang Zheng
PROMISE
2010
13 years 4 months ago
On the value of learning from defect dense components for software defect prediction
BACKGROUND: Defect predictors learned from static code measures can isolate code modules with a higher than usual probability of defects. AIMS: To improve those learners by focusi...
Hongyu Zhang, Adam Nelson, Tim Menzies
ITA
2006
13 years 10 months ago
Probabilistic models for pattern statistics
In this work we study some probabilistic models for the random generation of words over a given alphabet used in the literature in connection with pattern statistics. Our goal is t...
Massimiliano Goldwurm, Roberto Radicioni
CONSTRAINTS
2007
112views more  CONSTRAINTS 2007»
13 years 10 months ago
Maxx: Test Pattern Optimisation with Local Search Over an Extended Logic
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Francisco Azevedo
BMCBI
2006
148views more  BMCBI 2006»
13 years 10 months ago
Exploiting the full power of temporal gene expression profiling through a new statistical test: Application to the analysis of m
Background: The identification of biologically interesting genes in a temporal expression profiling dataset is challenging and complicated by high levels of experimental noise. Mo...
Veronica Vinciotti, Xiaohui Liu, Rolf Turk, Emile ...