1618 search results - page 20 / 324 » Testing random number generators |
JUCS
2006
13 years 9 months ago
2006
Abstract: Pseudorandom number generators are widely used in the area of simulation. Defective generators are still widely used in standard library programs, although better pseudor...
DSD
2005
IEEE
13 years 11 months ago
2005
IEEE
Several methods improving the fault coverage in mixed-mode BIST are presented in this paper. The test is divided into two phases: the pseudo-random and deterministic. Maximum of f...
INFORMATICALT
2007
13 years 9 months ago
2007
Abstract. The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for ...
ICSE
2007
IEEE-ACM
14 years 10 months ago
2007
IEEE-ACM
We present a technique that improves random test generation by incorporating feedback obtained from executing test inputs as they are created. Our technique builds inputs incremen...
ET
2002
13 years 9 months ago
2002
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...