1618 search results - page 22 / 324 » Testing random number generators |
ITC
1994
IEEE
14 years 1 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
ISCAS
2003
IEEE
14 years 3 months ago
2003
IEEE
A deterministic dynamic element matching (DEM) approach to ADC testing is introduced and compared with a common random DEM method. With both approaches, a highly non-ideal DAC is ...
IJNSEC
2010
13 years 4 months ago
2010
Chaotic systems have many interesting features such as sensitivity on initial condition and system parameter, ergodicity and mixing properties. In this paper, we exploit these int...
SIGSOFT
1998
ACM
14 years 2 months ago
1998
ACM
This paper reports on an empirical evaluation of the fault-detecting ability of two white-box software testing techniques: decision coverage (branch testing) and the all-uses data...
ICDT
1999
ACM
14 years 2 months ago
1999
ACM
A large number of database index structures have been proposed over the last two decades, and little consensus has emerged regarding their relative e ectiveness. In order to empir...