1618 search results - page 38 / 324 » Testing random number generators |
KBSE
2008
IEEE
14 years 4 months ago
2008
IEEE
Abstract—A poorly understood but important factor in random testing is the selection of a maximum length for test runs. Given a limited time for testing, it is seldom clear wheth...
SOFSEM
2012
Springer
12 years 5 months ago
2012
Springer
The classical group testing problem asks to determine at most d defective elements in a set of n elements, by queries to subsets that return Yes if the subset contains some defecti...
PTS
2010
13 years 7 months ago
2010
We present a novel algorithm for test data generation that is based on techniques used in formal software verification. Prominent examples of such formal techniques are symbolic ex...
VLSID
2007
IEEE
14 years 10 months ago
2007
IEEE
We introduce a novel method of test generation for microprocessors at the RTL using spectral methods. Test vectors are generated for RTL faults, which are the stuck-at faults on i...
ET
2000
13 years 9 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...