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VLSID
1995
IEEE
107views VLSI» more  VLSID 1995»
13 years 11 months ago
Functional test generation for non-scan sequential circuits
Mandyam-Komar Srinivas, James Jacob, Vishwani D. A...
APPROX
2010
Springer
131views Algorithms» more  APPROX 2010»
13 years 9 months ago
Testing Boolean Function Isomorphism
Noga Alon, Eric Blais
SODA
1992
ACM
90views Algorithms» more  SODA 1992»
13 years 9 months ago
Self-Testing Polynomial Functions Efficiently and Over Rational Domains
In this paper we give the first self-testers and checkers for polynomials over rational and integer domains. We also show significantly stronger bounds on the efficiency of a simp...
Ronitt Rubinfeld, Madhu Sudan