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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
13 years 11 months ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
SE
2010
13 years 9 months ago
Multi-Level Test Models for Embedded Systems
Abstract: Test methodologies for large embedded systems fail to reflect the test process as a whole. Instead, the test process is divided into independent test levels feaifferences...
Abel Marrero Pérez, Stefan Kaiser
NCI
2004
188views Neural Networks» more  NCI 2004»
13 years 9 months ago
Training set optimization in 3D human face recognition by RBF neural networks
In the Neural Networks approach by Radial Basis Function - RBF, the property of interpolation between faces, their variation, and the diversity of faces helps to minimize the outp...
Antonio C. Zimmermann, L. S. Encinas, L. O. Marin,...
FLAIRS
2008
13 years 10 months ago
Declarative Specification and Interpretation of Rule-Based Systems
A declarative rule inference engine can be very useful for modern distributed or heterogeneous applications, if it can be configured for multiple semantics and evaluation strategi...
Dietmar Seipel, Joachim Baumeister
TAICPART
2010
IEEE
126views Education» more  TAICPART 2010»
13 years 6 months ago
Improved Testing through Refactoring: Experience from the ProTest Project
We report on how the Wrangler refactoring tool has been used to improve and transform test code for Erlang systems. This has been achieved through the removal of code clones, the i...
Huiqing Li, Simon J. Thompson