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VTS
2002
IEEE
113views Hardware» more  VTS 2002»
14 years 14 days ago
LI-BIST: A Low-Cost Self-Test Scheme for SoC Logic Cores and Interconnects
For deep sub-micron system-on-chips (SoC), interconnects are critical determinants of performance, reliability and power. Buses and long interconnects being susceptible to crossta...
Krishna Sekar, Sujit Dey
ICSE
2007
IEEE-ACM
14 years 1 months ago
Enhancing Software Testing by Judicious Use of Code Coverage Information
Recently, tools for the analysis and visualization of code coverage have become widely available. At first glance, their value in assessing and improving the quality of automated ...
Stefan Berner, Roland Weber, Rudolf K. Keller
ISSTA
2006
ACM
14 years 1 months ago
APTE: automated pointcut testing for AspectJ programs
Aspect-Oriented Programming (AOP) has been proposed as a methodology that provides new modularization of software systems by allowing encapsulation of cross-cutting concerns. Aspe...
Prasanth Anbalagan, Tao Xie
CEC
2009
IEEE
13 years 11 months ago
Automatic system identification based on coevolution of models and tests
In evolutionary robotics, controllers are often designed in simulation, then transferred onto the real system. Nevertheless, when no accurate model is available, controller transfe...
Sylvain Koos, Jean-Baptiste Mouret, Stéphan...
IJCAI
1997
13 years 9 months ago
An Achievement Test for Knowledge-Based Systems: QUEM
This paper describes QUEM, a method for assessing the skill level of a knowledge-based system based on the quality of the solutions it produces. QUEM is demonstrated by using it t...
Caroline C. Hayes, Michael I. Parzen