4457 search results - page 73 / 892 » Tests of Machine Intelligence |
ASWEC
2005
IEEE
14 years 3 months ago
2005
IEEE
Starting with a UML specification that captures the underlying functionality of some given Java-based concurrent system, we describe a systematic way to construct, from this speci...
ICML
2007
IEEE
14 years 11 months ago
2007
IEEE
We address classification problems for which the training instances are governed by a distribution that is allowed to differ arbitrarily from the test distribution--problems also ...
FATES
2003
Springer
14 years 3 months ago
2003
Springer
We present work on a tool environment for model-based testing with the Abstract State Machine Language (AsmL). Our environment supports semiautomatic parameter generation, call seq...
ICST
2009
IEEE
14 years 4 months ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
KDD
2000
ACM
14 years 1 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...