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» The Challenge of Process Data Warehousing
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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
14 years 13 days ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
BMCBI
2008
99views more  BMCBI 2008»
13 years 9 months ago
Ranking analysis of F-statistics for microarray data
Background: Microarray technology provides an efficient means for globally exploring physiological processes governed by the coordinated expression of multiple genes. However, ide...
Yuan-De Tan, Myriam Fornage, Hongyan Xu
WISE
2009
Springer
14 years 6 months ago
Web Queries: From a Web of Data to a Semantic Web
ct One significant effort towards combining the virtues of Web search, viz. being accessible to untrained users and able to cope with vastly heterogeneous data, with those of dat...
François Bry, Tim Furche, Klara A. Weiand
3DIM
1999
IEEE
14 years 1 months ago
Large Data Sets and Confusing Scenes in 3-D Surface Matching and Recognition
In this paper, we report on recent extensions to a surface matching algorithm based on local 3-D signatures. This algorithm was previously shown to be effective in view registrati...
Owen T. Carmichael, Daniel F. Huber, Martial Heber...
INFOCOM
2009
IEEE
14 years 3 months ago
Time Valid One-Time Signature for Time-Critical Multicast Data Authentication
Abstract—It is challenging to provide authentication to timecritical multicast data, where low end-to-end delay is of crucial importance. Consequently, it requires not only effi...
Qiyan Wang, Himanshu Khurana, Ying Huang, Klara Na...