Computer assisted tomography (CAT) systems demandlarge amounts of time and space. In this paper, wedescribe an approachto solving the CAT problemusing several AItechniques includi...
John F. Kolen, David A. Shamma, Thomas Reichherzer...
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
Complex code bases require continual testing to ensure that both new development and routine maintenance do not create unintended side effects. Automation of regression testing is...
Joshua Hursey, Ethan Mallove, Jeffrey M. Squyres, ...
Firewalls are a cornerstone of todays security infrastructure for networks. Their configuration, implementing a firewall policy, is inherently complex, hard to understand, and diff...
Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test meth...