2877 search results - page 69 / 576 » The Complexity of Planarity Testing |
FLAIRS
1998
13 years 10 months ago
1998
Computer assisted tomography (CAT) systems demandlarge amounts of time and space. In this paper, wedescribe an approachto solving the CAT problemusing several AItechniques includi...
ETS
2010
IEEE
13 years 10 months ago
2010
IEEE
Testing of 3D stacked ICs (SICs) is becoming increasingly important in the semiconductor industry. In this paper, we address the problem of test architecture optimization for 3D s...
PVM
2007
Springer
14 years 3 months ago
2007
Springer
Complex code bases require continual testing to ensure that both new development and routine maintenance do not create unintended side effects. Automation of regression testing is...
PTS
2008
13 years 10 months ago
2008
Firewalls are a cornerstone of todays security infrastructure for networks. Their configuration, implementing a firewall policy, is inherently complex, hard to understand, and diff...
ITC
1999
IEEE
14 years 1 months ago
1999
IEEE
Static Component Interconnection Test Technology (SCITT) is a new XNOR circuit based technology that is used for board-level interconnection test. SCITT provides an easy test meth...