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» The Complexity of Planarity Testing
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VTS
1995
IEEE
94views Hardware» more  VTS 1995»
15 years 7 months ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
ERSA
2010
159views Hardware» more  ERSA 2010»
15 years 2 months ago
Acceleration of FPGA Fault Injection Through Multi-Bit Testing
SRAM-based FPGA devices are an attractive option for data processing on space-based platforms, due to high computational capabilities and a lower power envelope than traditional pr...
Grzegorz Cieslewski, Alan D. George, Adam Jacobs
ICPR
2006
IEEE
16 years 5 months ago
Testing The Torah Code Hypothesis: The Experimental Protocol
This is the second part of a tutorial discussing the experimental protocol issues in Testing the Torah Code Hypothesis. The principal concept is the test statistic which is used t...
Robert M. Haralick
CHI
2005
ACM
16 years 4 months ago
Automatic generation of high coverage usability tests
Software systems are often complex in the number of features that are available through the user interface and consequently, the number of interactions that can occur. Such system...
Renée C. Bryce
GECCO
2009
Springer
144views Optimization» more  GECCO 2009»
15 years 10 months ago
Using automated search to generate test data for matlab
The critical functionality of many software applications relies on code that performs mathematically complex computations. However, such code is often difficult to test owing to t...
Sion Ll Rhys, Simon M. Poulding, John A. Clark