993 search results - page 185 / 199 » The Complexity of Probabilistic EL |
ISCA
2007
IEEE
14 years 1 months ago
2007
IEEE
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
QEST
2007
IEEE
14 years 1 months ago
2007
IEEE
We give an overview of GRIP, a symmetry reduction tool for the probabilistic model checker PRISM, together with experimental results for a selection of example specifications. 1 ...
CIA
2007
Springer
14 years 1 months ago
2007
Springer
Trust learning is a crucial aspect of information exchange, negotiation, and any other kind of social interaction among autonomous agents in open systems. But most current probabil...
IPSN
2007
Springer
14 years 1 months ago
2007
Springer
We study the problem of aggregating data from a sparse set of nodes in a wireless sensor network. This is a common situation when a sensor network is deployed to detect relatively...
SOFSEM
2007
Springer
14 years 1 months ago
2007
Springer
Digital technology is increasingly deployed in safety-critical situations. This calls for systematic design and verification methodologies that can cope with three major sources o...