225 search results - page 4 / 45 » The Design and Optimization of SOC Test Solutions |
ET
2002
13 years 7 months ago
2002
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
Test access is a major problem for core-based systemon-chip (SOC) designs. Since cores in an SOC are not directly accessible via chip inputs and outputs, special access mechanisms...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
The test time for core-external interconnect shorts/opens is typically much less than that for core-internal logic. Therefore, prior work on test infrastructure design for core-ba...
ISQED
2003
IEEE
14 years 22 days ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
ICCAD
2000
IEEE
13 years 12 months ago
2000
IEEE
Spurred by technology leading to the availability of millions of gates per chip, system-level integration is evolving as a new paradigm, allowing entire systems to be built on a s...