604 search results - page 16 / 121 » The Hardness of Metric Labeling |
CVPR
2012
IEEE
11 years 10 months ago
2012
IEEE
In this article, we focus on the problem of large-scale instance-level image retrieval. For efficiency reasons, it is common to represent an image by a fixed-length descriptor w...
STOC
2005
ACM
14 years 8 months ago
2005
ACM
A low-distortion embedding between two metric spaces is a mapping which preserves the distances between each pair of points, up to a small factor called distortion. Low-distortion...
KDD
2005
ACM
14 years 1 months ago
2005
ACM
Data clustering represents an important tool in exploratory data analysis. The lack of objective criteria render model selection as well as the identification of robust solutions...
KDD
2012
ACM
11 years 10 months ago
2012
ACM
Multi-label learning arises in many real-world tasks where an object is naturally associated with multiple concepts. It is well-accepted that, in order to achieve a good performan...
ICML
2003
IEEE
14 years 8 months ago
2003
IEEE
Distance-based methods in machine learning and pattern recognition have to rely on a metric distance between points in the input space. Instead of specifying a metric a priori, we...