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» The Hardness of Metric Labeling
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ICCV
2005
IEEE
14 years 1 months ago
A Unifying Approach to Hard and Probabilistic Clustering
We derive the clustering problem from first principles showing that the goal of achieving a probabilistic, or ”hard”, multi class clustering result is equivalent to the algeb...
Ron Zass, Amnon Shashua
IS
2011
13 years 3 months ago
Similarity of business process models: Metrics and evaluation
—It is common for large and complex organizations to maintain repositories of business process models in order to document and to continuously improve their operations. Given suc...
Remco M. Dijkman, Marlon Dumas, Boudewijn F. van D...
CVPR
2000
IEEE
14 years 10 months ago
Discriminant-EM Algorithm with Application to Image Retrieval
In Proc. of IEEE Conf. on CVPR'2000, Vol.I, pp.222-227, Hilton Head Island, SC, 2000 In many vision applications, the practice of supervised learning faces several difficulti...
Ying Wu, Qi Tian, Thomas S. Huang
IJCAI
2007
13 years 9 months ago
Document Summarization Using Conditional Random Fields
Many methods, including supervised and unsupervised algorithms, have been developed for extractive document summarization. Most supervised methods consider the summarization task ...
Dou Shen, Jian-Tao Sun, Hua Li, Qiang Yang, Zheng ...
ICASSP
2011
IEEE
12 years 11 months ago
Semi-supervised handwritten digit recognition using very few labeled data
We propose a novel semi-supervised classifier for handwritten digit recognition problems that is based on the assumption that any digit can be obtained as a slight transformation...
Steven Van Vaerenbergh, Ignacio Santamaría,...