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VLSID
2008
IEEE
149views VLSI» more  VLSID 2008»
14 years 9 months ago
NBTI Degradation: A Problem or a Scare?
Negative Bias Temperature Instability (NBTI) has been identified as a major and critical reliability issue for PMOS devices in nano-scale designs. It manifests as a negative thres...
Kewal K. Saluja, Shriram Vijayakumar, Warin Sootka...
ISI
2004
Springer
14 years 2 months ago
Critical Infrastructure Integration Modeling and Simulation
The protection of critical infrastructures, such as electrical power grids, has become a primary concern of many nation states in recent years. Critical infrastructures involve mul...
William J. Tolone, David Wilson, Anita Raja, Wei-N...
AINA
2005
IEEE
14 years 2 months ago
Throughput Driven, Highly Available Streaming Stored Playback Video Service over a Peer-to-Peer Network
Streaming video is a key functionality in Internet based services such as distant education, VoD etc.,. The high bandwidth requirements associated with such applications coupled w...
K. Kalapriya, S. K. Nandy
HIPC
2009
Springer
13 years 6 months ago
Highly scalable algorithm for distributed real-time text indexing
Stream computing research is moving from terascale to petascale levels. It aims to rapidly analyze data as it streams in from many sources and make decisions with high speed and a...
Ankur Narang, Vikas Agarwal, Monu Kedia, Vijay K. ...
DSD
2009
IEEE
124views Hardware» more  DSD 2009»
14 years 3 months ago
Network-on-Chip Architecture Exploration Framework
— In this paper, we present a novel framework for the automated generation of Network-on-Chips (NoC) architectures, that enables architecture exploration and optimization. The au...
Timo Schönwald, Jochen Zimmermann, Oliver Bri...