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» The Need for Metrics in Visual Information Analysis
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IPCV
2007
13 years 9 months ago
Use of Paraplanar Constraint for Parallel Inspection of Wafer Bump Heights
- The shrunk dimension of electronic devices leads to more stringent requirement on process control and quality assurance of their fabrication. For instance, direct die-to-die bond...
Mei Dong, Ronald Chung, Edmund Y. Lam, Kenneth S. ...
HVEI
2010
13 years 5 months ago
No-reference image quality assessment based on localized gradient statistics: application to JPEG and JPEG2000
This paper presents a novel system that employs an adaptive neural network for the no-reference assessment of perceived quality of JPEG/JPEG2000 coded images. The adaptive neural ...
Hantao Liu, Judith Redi, Hani Alers, Rodolfo Zunin...
ICALP
2011
Springer
12 years 11 months ago
On the Advice Complexity of the k-Server Problem
Competitive analysis is the established tool for measuring the output quality of algorithms that work in an online environment. Recently, the model of advice complexity has been in...
Hans-Joachim Böckenhauer, Dennis Komm, Rastis...
SC
2005
ACM
14 years 1 months ago
PerfExplorer: A Performance Data Mining Framework For Large-Scale Parallel Computing
Parallel applications running on high-end computer systems manifest a complexity of performance phenomena. Tools to observe parallel performance attempt to capture these phenomena...
Kevin A. Huck, Allen D. Malony
INEX
2004
Springer
14 years 1 months ago
Mixture Models, Overlap, and Structural Hints in XML Element Retrieval
We describe the INEX 2004 participation of the Informatics Institute of the University of Amsterdam. We completely revamped our XML retrieval system, now implemented as a mixture l...
Börkur Sigurbjörnsson, Jaap Kamps, Maart...