As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit C...
- In this paper, we present a design methodology for automatic platform generation of future heterogeneous systems where communication happens via the Network-onChip (NoC) approach...
— Applications raising in many scientific fields exhibit both data and task parallelism that have to be exploited efficiently. A classic approach is to structure those applica...
Graph clustering has become ubiquitous in the study of relational data sets. We examine two simple algorithms: a new graphical adaptation of the k-medoids algorithm and the Girvan...
A significant input-data uncertainty is often present in practical situations. One approach to coping with this uncertainty is to describe the uncertainty with scenarios. A scenar...
Jurij Mihelic, Amine Mahjoub, Christophe Rapine, B...