43 search results - page 5 / 9 » The effect of code coverage on fault detection under differe... |
ICSM
2005
IEEE
14 years 1 months ago
2005
IEEE
Test suite reduction is an important test maintenance activity that attempts to reduce the size of a test suite with respect to some criteria. Emerging trends in software developm...
IFIP
2001
Springer
13 years 12 months ago
2001
Springer
: High defect coverage requires good coverage of different fault types. In this paper, we present a comprehensive test vector generation technique for BIST, called Random Single In...
ICSE
2003
IEEE-ACM
14 years 7 months ago
2003
IEEE-ACM
g Test Suites via Operational Abstraction Michael Harder Jeff Mellen Michael D. Ernst MIT Lab for Computer Science 200 Technology Square Cambridge, MA 02139 USA {mharder,jeffm,mern...
TCAD
2008
13 years 7 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...