870 search results - page 79 / 174 » The statistical significance of the MUC-4 results |
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
RECOMB
2005
Springer
14 years 8 months ago
2005
Springer
An accurate scoring function for database search is crucial for peptide identification using tandem mass spectrometry. Although many mathematical models have been proposed to scor...
EUROSYS
2006
ACM
14 years 5 months ago
2006
ACM
Computer problem diagnosis remains a serious challenge to users and support professionals. Traditional troubleshooting methods relying heavily on human intervention make the proce...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Reliable prediction of parametric yield for a specific design is difficult; a significant reason is the reliance of the yield estimation methods on the hard-to-measure distributio...
FGR
2008
IEEE
14 years 2 months ago
2008
IEEE
Automatic facial feature localization has been a longstanding challenge in the field of computer vision for several decades. This can be explained by the large variation a face i...