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107
Voted
ICCAD
2006
IEEE
16 years 23 days ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
127
Voted
SOSP
2007
ACM
16 years 23 days ago
2007
ACM
We introduce a new reliability infrastructure for file systems called I/O shepherding. I/O shepherding allows a file system developer to craft nuanced reliability policies to de...
184
Voted
CVPR
2010
IEEE
16 years 4 days ago
2010
IEEE
Although not commonly used, correlation filters can track complex objects through rotations, occlusions and other distractions at over 20 times the rate of current state-ofthe-ar...
132
Voted
CVPR
2010
IEEE
16 years 2 days ago
2010
IEEE
Object recognition is challenging due to high intra-class
variability caused, e.g., by articulation, viewpoint changes,
and partial occlusion. Successful methods need to strike a...
147
click to vote
CVPR
2010
IEEE
15 years 11 months ago
2010
IEEE
Image-analysis methods play an important role in helping detect brain changes in and diagnosis of Alzheimer's Disease (AD). In this paper, we propose an automatic unsupervised...