Process variability has a detrimental impact on the performance of memories and other system components, which can lead to parametric yield loss at the system level due to timing ...
Antonis Papanikolaou, T. Grabner, Miguel Miranda, ...
Abstract--In distributed embedded systems operated by battery, energy management is a critical issue that has to be addressed at different architecture levels. For systems that tig...
Gianluca Franchino, Giorgio C. Buttazzo, Mauro Mar...
In this paper we discuss our initial experiences adapting OpenMP to enable it to serve as a programming model for high performance embedded systems. A high-level programming model...
Barbara M. Chapman, Lei Huang, Eric Biscondi, Eric...
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikara...
Abstract-This paper describes the design and verification of a high-performance asynchronous differential equation solver benchmark circuit. The design has low control overhead whi...
Kenneth Y. Yun, Ayoob E. Dooply, Julio Arceo, Pete...