4306 search results - page 189 / 862 » Timed Testing with TorX |
ISVLSI
2007
IEEE
14 years 5 months ago
2007
IEEE
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
CCGRID
2007
IEEE
14 years 5 months ago
2007
IEEE
The Grid promise is starting to materialize today: largescale multi-site infrastructures have grown to assist the work of scientists from all around the world. This tremendous gro...
ETS
2006
IEEE
14 years 4 months ago
2006
IEEE
The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faul...
ASPDAC
2006
ACM
14 years 4 months ago
2006
ACM
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
GECCO
2005
Springer
14 years 4 months ago
2005
Springer
Reactive real-time systems have to react to external events within time constraints: Triggered tasks must execute within deadlines. The goal of this article is to automate, based ...