4306 search results - page 29 / 862 » Timed Testing with TorX |
DELTA
2004
IEEE
13 years 11 months ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
TSMC
2008
13 years 7 months ago
2008
Testing complex manufacturing systems, such as an ASML [1] lithographic machine, takes up to 45% of the total development time of a system. The problem of which tests must be execu...
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
ECBS
2010
IEEE
13 years 11 months ago
2010
IEEE
Model-based selective regression testing promises reduction in cost and labour by selecting a subset of the test suite corresponding to the modifications after system evolution. H...
ATS
2001
IEEE
13 years 11 months ago
2001
IEEE
Testing and diagnosis are important issues in system-onchip (SOC) development, as more and more embedded cores are being integrated into the chips. In this paper we propose a buil...