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ESA
1993
Springer
109views Algorithms» more  ESA 1993»
13 years 11 months ago
Optimal Upward Planarity Testing of Single-Source Digraphs
A digraph is upward planar if it has a planar drawing such that all the edges are monotone with respect to the vertical direction. Testing upward planarity and constructing upward ...
Paola Bertolazzi, Giuseppe Di Battista, Carlo Mann...
ECCC
2011
223views ECommerce» more  ECCC 2011»
13 years 2 months ago
A Case of Depth-3 Identity Testing, Sparse Factorization and Duality
Polynomial identity testing (PIT) problem is known to be challenging even for constant depth arithmetic circuits. In this work, we study the complexity of two special but natural ...
Chandan Saha, Ramprasad Saptharishi, Nitin Saxena
IAAI
1993
13 years 9 months ago
Dodger, a Diagnostic Expert System for the Evaluation of Nondestructive Test Data
Identification and characterization of indications in eddy current (ET) signals can be highly subjective in nature, with varying diagnoses made by different analysts or by a singl...
Arthur J. Levy, Jane E. Oppenlander, David M. Brud...
ATS
1998
IEEE
76views Hardware» more  ATS 1998»
13 years 12 months ago
Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits
We propose a new static test set compaction method based on a careful examination of attributes of fault coverage curves. Our method is based on two key ideas: 1 fault-list and te...
Michael S. Hsiao, Srimat T. Chakradhar
DAGSTUHL
2004
13 years 9 months ago
Testing with Functions as Specifications
Although computer systems penetrate all facets of society, the software running those systems may contain many errors. Producing high quality software appears to be difficult and v...
Pieter W. M. Koopman