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VTS
1997
IEEE
90views Hardware» more  VTS 1997»
13 years 11 months ago
SHOrt voltage elevation (SHOVE) test for weak CMOS ICs
A stress procedure for reliability screening, SHOrt Voltage Elevation (SHOVE) test, is analyzed here. During SHOVE, test vectors are run at higher-than-normal supply voltage for a...
Jonathan T.-Y. Chang, Edward J. McCluskey
AICCSA
2001
IEEE
83views Hardware» more  AICCSA 2001»
13 years 11 months ago
A Measure for Component Interaction Test Coverage
A trend in software development is to assemble a system from a number of components. These may be either available commercially off-the-shelf, or by the use of network-based resou...
Alan W. Williams, Robert L. Probert
EVOW
2008
Springer
13 years 9 months ago
An Evolutionary Methodology for Test Generation for Peripheral Cores Via Dynamic FSM Extraction
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
Danilo Ravotto, Ernesto Sánchez, Massimilia...
ECRTS
2009
IEEE
13 years 5 months ago
Implementation of a Speedup-Optimal Global EDF Schedulability Test
A recent result in [13] has demonstrated the existence of a sufficient global EDF schedulability test for sporadic task systems that makes the following guarantee: any task system...
Sanjoy K. Baruah, Vincenzo Bonifaci, Alberto March...
SPLC
2008
13 years 9 months ago
Functional Testing of Feature Model Analysis Tools. A First Step
The automated analysis of Feature Models (FMs) focuses on the usage of different logic paradigms and solvers to implement a number of analysis operations on FMs. The implementatio...
Sergio Segura, David Benavides, Antonio Ruiz Cort&...