Sciweavers

176 search results - page 29 / 36
» Timed Verification of Asynchronous Circuits
Sort
View
DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 2 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
ASYNC
2003
IEEE
100views Hardware» more  ASYNC 2003»
14 years 28 days ago
Congestion and Starvation Detection in Ripple FIFOs
High-speed asynchronous ripple FIFOs may be easily embedded in synchronous environments and can elegantly handle the problem of forwarding data between clock domains. In cases whe...
William S. Coates, Robert J. Drost
CDC
2008
IEEE
128views Control Systems» more  CDC 2008»
14 years 2 months ago
Time-robust discrete control over networked Loosely Time-Triggered Architectures
In this paper we consider Loosely Time-Triggered Architectures (LTTA) as a networked infrastructure for deploying discrete control. LTTA are distributed architectures in which 1/ ...
Paul Caspi, Albert Benveniste
LCTRTS
2010
Springer
13 years 5 months ago
Translating concurrent action oriented specifications to synchronous guarded actions
Concurrent Action-Oriented Specifications (CAOS) model the behavior of a synchronous hardware circuit as asynchronous guarded at an abstraction level higher than the Register Tran...
Jens Brandt, Klaus Schneider, Sandeep K. Shukla
DAC
2003
ACM
14 years 8 months ago
Random walks in a supply network
This paper presents a power grid analyzer based on a random walk technique. A linear-time algorithm is first demonstrated for DC analysis, and is then extended to perform transien...
Haifeng Qian, Sani R. Nassif, Sachin S. Sapatnekar