In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...
Solving logic puzzles has become a very popular past-time, particularly since the Sudoku puzzle started appearing in newspapers all over the world. We have developed a puzzle gene...
We present a new random search method for solving simulation optimization problems. Our approach emphasizes the need for maintaining the right balance between exploration and expl...
Recently, there has been much interest in enhancing purely combinatorial formalisms with numerical information. For example, planning formalisms can be enriched by taking resource...
We consider the problem of designing error correcting codes (ECC), a hard combinatorial optimization problem of relevance in the field of telecommunications. This problem is firs...
Jhon Edgar Amaya, Carlos Cotta, Antonio J. Fern&aa...