32 search results - page 7 / 7 » Total leakage power optimization with improved mixed gates |
HPCA
2009
IEEE
14 years 2 months ago
2009
IEEE
As transistor process technology approaches the nanometer scale, process variation significantly affects the design and optimization of high performance microprocessors. Prior stu...
ISCA
2009
IEEE
14 years 2 months ago
2009
IEEE
Analysis of technology and application trends reveals a growing imbalance in the peak compute-to-memory-capacity ratio for future servers. At the same time, the fraction contribut...