1219 search results - page 119 / 244 » Towards automatization of domain modeling |
ISQED
2010
IEEE
14 years 4 months ago
2010
IEEE
Abstract— As the semiconductor technology continues its marching toward the deep sub-micron domain, the strong relation between leakage current and temperature becomes critical i...
ASWSD
2006
Springer
14 years 1 months ago
2006
Springer
Abstract. Test processes in the automotive industry are tool-intensive and affected by technologically heterogeneous test infrastructures. In the industrial practice a product has ...
ICST
2008
IEEE
14 years 4 months ago
2008
IEEE
Testing remains a major challenge for model transformation development. Test models that are used as test data for model transformations, are constrained by various sources of kno...
ICANNGA
2009
Springer
14 years 4 months ago
2009
Springer
Many complex, real world phenomena are difficult to study directly using controlled experiments. Instead, the use of computer simulations has become commonplace as a feasible alte...
DATE
2009
IEEE
14 years 4 months ago
2009
IEEE
Abstract—This paper summarizes a special session on multicore/multi-processor system-on-chip (MPSoC) programming challenges. The current trend towards MPSoC platforms in most com...