In this paper, we propose a fault-tolerant mechanism for microprocessors, which detects transient faults and recovers from them. There are two driving force to investigate fault-t...
- The electrical effects of CMOS IC physical defects that caused stuck-openfaults are evaluated, including their voltage levels, quiescent power supply current (IDDQ), transient re...
Jerry M. Soden, R. Keith Treece, Michael R. Taylor...
This paper proposes a new link for asynchronous NoC communications that is resilient to transient faults on the wires of the link without impact on the data transfer capability. R...
Simon Ogg, Bashir M. Al-Hashimi, Alexandre Yakovle...
Continuously shrinking feature sizes result in an increasing susceptibility of circuits to transient faults, e.g. due to environmental radiation. Approaches to implement fault tol...
Abstract. An important step in achieving robustness to run-time faults is the ability to detect and repair problems when they arise in a running system. Effective fault detection a...
Paulo Casanova, Bradley R. Schmerl, David Garlan, ...