282 search results - page 34 / 57 » Transient Fault Detectors |
ASPLOS
2000
ACM
13 years 12 months ago
2000
ACM
Processors execute the full dynamic instruction stream to arrive at the final output of a program, yet there exist shorter instruction streams that produce the same overall effec...
CLEIEJ
2006
13 years 7 months ago
2006
This paper describes a single-version algorithmic approach to design in fault tolerant computing in various computing systems by using static redundancy in order to mask transient...
CGO
2009
IEEE
14 years 2 months ago
2009
IEEE
—As semiconductor technology scales into the deep submicron regime the occurrence of transient or soft errors will increase. This will require new approaches to error detection. ...
SAFECOMP
2007
Springer
14 years 1 months ago
2007
Springer
This paper presents an experimental evaluation of the fault-tolerant communication (FTCOM) layer of the DECOS integrated architecture. The FTCOM layer implements different agreemen...
DSN
2006
IEEE
14 years 1 months ago
2006
IEEE
The advent of deep sub-micron technology has exacerbated reliability issues in on-chip interconnects. In particular, single event upsets, such as soft errors, and hard faults are ...