282 search results - page 53 / 57 » Transient Fault Detectors |
DSN
2007
IEEE
14 years 1 months ago
2007
IEEE
Aggressive CMOS scaling will make future chip multiprocessors (CMPs) increasingly susceptible to transient faults, hard errors, manufacturing defects, and process variations. Exis...
DSN
2002
IEEE
14 years 13 days ago
2002
IEEE
Concentration of design effort for current single-chip Commercial-Off-The-Shelf (COTS) microprocessors has been directed towards performance. Reliability has not been the primary ...
USENIX
2007
13 years 9 months ago
2007
Memory state can be corrupted by the impact of particles causing single-event upsets (SEUs). Understanding and dealing with these soft (or transient) errors is important for syste...
NSDI
2008
13 years 9 months ago
2008
Much recent work on Byzantine state machine replication focuses on protocols with improved performance under benign conditions (LANs, homogeneous replicas, limited crash faults), ...
ENTCS
2007
13 years 7 months ago
2007
Transient faults that arise in large-scale software systems can often be repaired by re-executing the code in which they occur. Ascribing a meaningful semantics for safe re-execut...