Abstract--As society's dependence on network technology increases, the need for resilience and survivability in these services becomes increasingly apparent. Since the user ex...
Justin P. Rohrer, Ramya Naidu, James P. G. Sterben...
This paper presents a low-overhead scheme for built-in self-test of circuits with scan. Complete (100%) fault coverage is obtained without modifying the function logic and without...
This paper presents a new programming language named SPARCL that has four major elements: it is a visual language, it is a logic programming language, it relies on sets to organiz...
In this paper we analyze the relationship between cyclic definitions and consistency in GelfondLifschitz's answer sets semantics (initially defined as `stable model semantics...
In the ECAD area, the Test Generation (TG) problem consists in finding an input vector test for some possible diagnosis (a set of faults) of a digital circuit. Such tests may have ...