872 search results - page 56 / 175 » UML-based design test generation |
195
click to vote
FPGA
2004
ACM
15 years 7 months ago
2004
ACM
Field Programmable Gate Arrays (FPGAs) are an increasingly popular choice of platform for the implementation of cryptographic systems. Until recently, designers using FPGAs had le...
105
click to vote
DAC
2009
ACM
16 years 5 months ago
2009
ACM
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
143
click to vote
IJAIT
2000
15 years 3 months ago
2000
Knowledge-based engineering and computational intelligence are expected to become core technologies in the design and manufacturing for the next generation of space exploration mi...
117
click to vote
SIGIR
2004
ACM
15 years 9 months ago
2004
ACM
Although text categorization is a burgeoning area of IR research, readily available test collections in this field are surprisingly scarce. We describe a methodology and system (...
125
click to vote
DAC
2007
ACM
16 years 5 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...