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Publication
Within-die process variations arise during integrated circuit (IC) fabrication in the sub-100nm regime. These variations are of paramount concern as they deviate the performance of...
COMPSAC
2006
IEEE
14 years 4 months ago
2006
IEEE
Model-checking techniques are successfully used in the verification of both hardware and software systems of industrial relevance. Unfortunately, the capability of current techni...
EMSOFT
2006
Springer
14 years 22 days ago
2006
Springer
Distributed real-time and embedded (DRE) systems have stringent constraints on timeliness and other properties whose assurance is crucial to correct system behavior. Formal tools ...
CVGIP
2007
13 years 10 months ago
2007
This paper presents a technique for creating a smooth, closed surface from a set of 2D contours, which have been extracted from a 3D scan. The technique interprets the pixels that...
KBSE
2010
IEEE
13 years 9 months ago
2010
IEEE
We study the problem of statistical model checking of probabilistic systems for PCTL unbounded until property P1p(ϕ1 U ϕ2) (where 1 ∈ {<, ≤, >, ≥}) using the computa...