218 search results - page 32 / 44 » Using BIST Control for Pattern Generation |
ICDE
2012
IEEE
11 years 10 months ago
2012
IEEE
—We demonstrate SWITCH, a deep embedding of relational queries into RUBY and RUBY on RAILS. With SWITCH, there is no syntactic or stylistic difference between RUBY programs that ...
EURODAC
1994
IEEE
13 years 11 months ago
1994
IEEE
This paper presents a testability improvement method for digital systems described in VHDL behavioral specification. The method is based on testability analysis at registertransfe...
INTEGRATION
2006
13 years 7 months ago
2006
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
OOPSLA
2010
Springer
13 years 5 months ago
2010
Springer
This poster presents a design language and a tool suite covering the development life-cycle of a Sense/Compute/Control (SCC) application. This language makes it possible to define...
ECAL
2007
Springer
14 years 1 months ago
2007
Springer
Abstract. In psychology the ‘A not B’ error, whereby infants perseverate in reaching to the location where a toy was previously hidden after it has been moved to a new location...